LPKF ScanCheck MicroView

Inspection system with top resolution

The LPKF ScanCheck MicroView is the inspection system to use for the finest quality waferbump stencils and precision screens. This is possible due to its top resolution of 5000 dpi optically (25000 dpi interpolated).

Stencils with apertures down to 12µm diameter can be verified for dirt, geometrical details (like form, position and size), wrong holes, and more.

The system is covered by a protective housing to insulate it from dust contamination. Its powerful and intuitive software makes performing inspections an easy task.

The working area of the camera is freely selectable up to 610 mm x 460 mm. It scans with transmitted light and compares the image with the CAD data. Error tolerances are individually adjustable, and all detected errors are listed in a detailed report for review.

With continuing advances in miniaturization, verifying the smallest structures after manufacturing becomes more and more important. The LPKF MicroView ScanCheck gives safety.

The LPKF ScanCheck MicroView inspection system ensures the highest quality level for product verification, and provides a basis for ISO 9000 certification.